Oxford Instruments Asylum Research Announces the Cypher ES Polymer Edition, an Atomic Force Microscope Optimized for Polymer Research
18 September 2015

Due to the growing demands of polymer researchers who require fast, high resolution, and quantitative nanomechanical measurements, Oxford Instruments Asylum Research announces the Cypher™ ES Polymer Edition atomic force microscope (AFM). The new Cypher ES Polymer Edition AFM is optimized for polymer research offering highest resolution, fast scanning, heating, and the most comprehensive suite of nanomechanical characterization tools. The Cypher ES Polymer Edition is ideal for many polymer and material science applications such as imaging morphology and structure, measuring force and deformation, mapping nanomechanical and thermal properties, monitoring dynamic processes including solvent and thermal effects, and for probing electrical and functional behavior. For a limited time, special pricing and fast delivery is available for the Cypher ES Polymer Edition. Learn more at www.oxford-instruments.com/cypher-polymer-edition
“Asylum Research’s innovative nanomechanical scan modes and environmental capabilities have made it possible for us to address the specific demands of polymer scientists with our new Cypher ES Polymer Edition AFM system,” said John Green, Director of Sales. “Asylum Research is the only AFM manufacturer to offer high resolution and quantitative imaging of both the elastic and viscous response of materials. This is an essential capability for polymer scientists since virtually all polymers exhibit significant viscoelasticity. With the Cypher ES Polymer Edition AFM system, the polymer researcher now has many powerful tools within one system to operate efficiently, get quantitative data, and correlate results.”
The Cypher ES Polymer Edition includes three exclusive nanomechanical characterization techniques. Two AFM techniques, AM-FM and Contact Resonance Viscoelastic Mapping Modes, enable high resolution, quantitative mapping of both the elastic modulus and the viscous response (i.e. loss modulus or loss tangent). The third technique, Fast Force Mapping Mode, enables quantitative high-speed elastic modulus mapping. Unlike others, Asylum’s Fast Force Mapping Mode captures every force curve in the image, measures both deflection and the Z sensor signal, and supports both common indentation models like Hertz, Sneddon, and DMT along with more advanced models including JKR and Oliver-Pharr. 
Additionally, the Cypher ES Polymer Edition offers the highest resolution fast scanning AFM with integrated environmental control. It includes a high temperature sample heater, which integrates seamlessly without extra cables, tubing or controllers, to enable hassle-free exploration of polymer phase transition phenomena at temperatures up to 250°C. Finally, it includes Asylum’s exclusive blueDrive™ photothermal excitation option, which makes tapping mode operation simpler, more stable, and more quantitative.  
Researchers looking for educational material on AFM for polymer applications can find a wide range of application notes, webinars and real-world image examples from the website: www.oxford-instruments.com/afm-polymers.
Image below: Cypher ES Polymer Edition AFM pictured with an image of syndiotactic polypropylene (sPP) and polystyrene (PS) that was imaged after heating to  ~135° then allowed to cool. The round, isolated domains are PS and the continuous matrix around them is the sPP. Scan size 3 µm. Play the full movie at: http://www.oxford-instruments.com/polymer-movie
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