New Application Note Describes Atomic Force Microscopy Tools for Nanoscale Electrical Characterization
11 August 2016
(Santa Barbara, CA) The importance of characterizing electrical functionality on nanometer length scales continues to grow as devices shrink and new nanomaterials emerge. The inherent spatial resolution and high force sensitivity of the atomic force microscope (AFM) make it a powerful tool for nanoscale electrical properties, including current, surface charge and potential, dielectric breakdown, conductivity, electrical characterization. To this effect, Oxford Instruments Asylum Research has just released an informative new application note, “AFM Tools for Nanoscale Electrical Characterization”. The application note discusses the most recent nanoelectrical characterization techniques, as well as the benefits and exclusive modes that the Asylum Research Cypher™ and MFP-3D™ AFMs offer. Researchers will learn more about evaluating local electrical properties, including current, surface charge and potential, dielectric breakdown, conductivity, and permittivity. The application note can be downloaded at www.oxford-instruments.com/electrical-characterization.
“Not only do the dimensions of silicon-based devices keep shrinking to a few nanometers, but also next-generation processes with nanoscale components like nanotubes, graphene, and molecular building blocks are emerging. Understanding physical processes that control electrical behavior increasingly requires AFM measurements on smaller length scales,” said Keith Jones, Asylum Research Applications Scientist, specializing in electrical characterization. “This application note is a great reference for scientists new to AFM as well as those currently working in the field.”