New Application Note Describes Atomic Force Microscopy for Characterizing Electrical Double Layer Properties in Ionic Liquid Electrolytes
14 June 2017

As energy storage devices shrink, new characterization methods are necessary to allow in situ studies of nanoscale dynamics inside electrochemical cells. Learn how Atomic Force Microscopy (AFM) is being used to tackle this challenge with this informative new application note released by Oxford Instruments Asylum Research — “Toward Better Charge Storage: AFM Determines Key Electrical Double Layer (EDL) Properties in Future Ionic Liquid Electrolytes”. The application note discusses how AFM can be used for high resolution imaging of the ionic liquid EDL, as well as measuring the ion layering in electrochemical capacitors with force curves. The application note can be downloaded at http://www.oxford-instruments.com/AFM-Ionic-Liquid-App-Note.

“AFM can be used to probe the structure of ionic liquids at higher spatial resolutions and offers unique experimental capabilities and advantages over other methods,” said Jason Li, Applications Group Manager at Asylum Research. “This white paper is an excellent resource for scientists working in this field that would like to learn how AFM can better characterize EDL properties.”

Versatile, high-performance sealed electrochemistry cells are available for both MFP-3D family AFMs and Cypher ES and Cypher VRS AFMs. Asylum Research AFMs are being used by leading researchers around the globe for characterizing numerous materials for energy storage. A variety of their publications can be found at: www.oxford-instruments.com/energy-storage.

Ionic liquid structure at an electrode surface measured with an Asylum Research Cypher AFM