Discover the market leading range of EBSD detectors based on CMOS technology: a world first in innovative technology. Oxford Instruments has revolutionised EBSD performance through the innovative application of CMOS technology.
The key to CMOS sensor performance is:
The parallel nature of the data read-out
Higher resolution patterns acquired in a shorter time
Diffraction patterns with 16x more pixels acquired at twice the rate of the fastest CCD-based detectors.
No more pixel binning, no more compromise, just awesome results. Every time.
Be a part of the CMOS-EBSD evolution.
CMOS EBSD Detector Range
CMOS EBSD Detector Range
Discover the market leading range of EBSD detectors based on CMOS technology: a world first in innovative technology.
Oxford Instruments has revolutionised EBSD performance through the innovative application of CMOS technology.
C–Nano is an outstanding entry-level CMOS EBSD detector. It delivers megapixel pattern resolution coupled with speeds up to 400 patterns per second (pps). It is at least 3x faster than comparable CCD based detectors, at highest pattern resolutions.
Advanced, high efficiency optics are integral to the full CMOS EBSD range. This ensures high sensitivity, superior pattern quality, coupled with best data quality.
1244 x 1024 high resolution pattern from Zirconium oxide.
Orientation map of a synthetic Al2O3 nacre sample, collected at ~350 pps. Sample courtesy of Dr. Thierry Douillard, INSA Lyon
C–Swift is a higher throughput CMOS EBSD detector for routine materials analysis. With speeds up to 1,000 pps, C–Swift delivers exceptional high-speed materials characterisation.
The CMOS technology ensures high quality diffraction patterns, with up to 4x more pattern detail than equivalent CCD-based detectors at the top speeds. This ensures class leading indexing rates on even the most challenging samples, without the need for compromising pattern averaging routines.
Ideal detector for:
Routine industrial analyses and quality control
High throughput sample characterisation (e.g. grain characterisation)
Materials Science and Metallurgy
Orientation map of a 2-phase Ti64 alloy sample, collected at 972 pps. Sample courtesy of Materials Consultancy Services Ltd, UK
Symmetry is a revolutionary new EBSD detector from Oxford Instruments based on customised CMOS technology, providing unprecedented performance and ease of use:
Over 3000 indexed patterns per second (pps)
Up to 30x faster than existing CCD-based detectors
Extreme sensitivity for low current and low kV analyses
1244 x 1024 pixel resolution, ideal for HR-EBSD applications
High resolution patterns at all speeds
Innovative design features for simple operation
Learn more about Symmetry
Symmetry Application Notes
Rapid Characterisation of Steel and Ni
The Symmetry detector is ideal for the routine characterisation of metal samples at speeds up to 3000 pps. Here it is used to characterise a deformed Ni superalloy and a large area across a welded duplex steel.
High Resolution EBSD Mapping of Martensitic Steel
Martensitic structures are traditionally challenging to measure with EBSD. Here, the sensitivity and pattern detail provided by Symmetry enables exceptional results from a martensitic stainless steel.
Transmission Kikuchi Diffraction (TKD) of Metals
Successful TKD analyses require an EBSD detector with both high speed and high sensitivity. The suitability of Symmetry for TKD is demonstrated here on both deformed Al alloys and nanocrystalline Ni.
Detailed Study of a Bivalve Shell
An in-depth look at the structures of a mussel shell, characterised using Symmetry. Both calcite and nanostructured aragonite nacre are measured with an unprecedented level of detail and speed.