Discover the market leading range of EBSD detectors based on CMOS technology: a world first in innovative technology.  Oxford Instruments has revolutionised EBSD performance through the innovative application of CMOS technology.

The key to CMOS sensor performance is:

  • The parallel nature of the data read-out
  • Higher resolution patterns acquired in a shorter time
  • Diffraction patterns with 16x more pixels acquired at twice the rate of the fastest CCD-based detectors.

No more pixel binning, no more compromise, just awesome results. Every time.
Be a part of the CMOS-EBSD evolution.

  • C-Nano
  • C-Swift
  • Symmetry


CMOS EBSD Detector Range

CMOS EBSD Detector Range

Discover the market leading range of EBSD detectors based on CMOS technology: a world first in innovative technology.

Oxford Instruments has revolutionised EBSD performance through the innovative application of CMOS technology.

PDF 1.51MB

C Nano

C–Nano is an outstanding entry-level CMOS EBSD detector. It delivers megapixel pattern resolution coupled with speeds up to 400 patterns per second (pps). It is at least 3x faster than comparable CCD based detectors, at highest pattern resolutions.
Advanced, high efficiency optics are integral to the full CMOS EBSD range. This ensures high sensitivity, superior pattern quality, coupled with best data quality.





1244 x 1024 high resolution pattern from Zirconium oxide.






Orientation map of a synthetic Al2O3 nacre sample, collected at ~350 pps. Sample courtesy of Dr. Thierry Douillard, INSA Lyon



C–Swift is a higher throughput CMOS EBSD detector for routine materials analysis. With speeds up to 1,000 pps, C–Swift delivers exceptional high-speed materials characterisation.

The CMOS technology ensures high quality diffraction patterns, with up to 4x more pattern detail than equivalent CCD-based detectors at the top speeds. This ensures class leading indexing rates on even the most challenging samples, without the need for compromising pattern averaging routines.
Ideal detector for:

  • Routine industrial analyses and quality control
  • High throughput sample characterisation (e.g. grain characterisation)
  • Materials Science and Metallurgy

Orientation map of a 2-phase Ti64 alloy sample, collected at 972 pps. Sample courtesy of Materials Consultancy Services Ltd, UK





Symmetry is a revolutionary new EBSD detector from Oxford Instruments based on customised CMOS technology, providing unprecedented performance and ease of use:

  • Over 3000 indexed patterns per second (pps)
  • Up to 30x faster than existing CCD-based detectors
  • Extreme sensitivity for low current and low kV analyses
  • 1244 x 1024 pixel resolution, ideal for HR-EBSD applications
  • High resolution patterns at all speeds
  • Innovative design features for simple operation

Learn more about Symmetry

Symmetry Application Notes

Rapid Characterisation of Steel and Ni

The Symmetry detector is ideal for the routine characterisation of metal samples at speeds up to 3000 pps. Here it is used to characterise a deformed Ni superalloy and a large area across a welded duplex steel.

PDF 8.30MB
High Resolution EBSD Mapping of Martensitic Steel

Martensitic structures are traditionally challenging to measure with EBSD. Here, the sensitivity and pattern detail provided by Symmetry enables exceptional results from a martensitic stainless steel.

PDF 3.10MB
Transmission Kikuchi Diffraction (TKD) of Metals

Successful TKD analyses require an EBSD detector with both high speed and high sensitivity. The suitability of Symmetry for TKD is demonstrated here on both deformed Al alloys and nanocrystalline Ni.

PDF 11.99MB
Symmetry High Sensitivity for Beam sensitive Materials

In this application, Symmetry is used to characterise a challenging biomaterial, shell nacre, and its performance is compared to conventional CCD-based detectors.

PDF 4.11MB
Characterising Complex Rock Samples using Symmetry

An eclogite sample containing 10 phases has been rapidly analysed using integrated EBSD and EDS. The performance of Symmetry enables high pattern resolution and good indexing, even at 250 pps.

PDF 3.77MB
Fast Characterisation of Deformed Quartz Rocks

A relatively simple geological sample, a quartz mylonite, is here characterised in a matter of minutes using Symmetry, collecting data at almost 1000 pps.

PDF 13.15MB
Detailed Study of a Bivalve Shell

An in-depth look at the structures of a mussel shell, characterised using Symmetry. Both calcite and nanostructured aragonite nacre are measured with an unprecedented level of detail and speed.

PDF 7.07MB
The Symmetry Advantage High Angular Resolution at High Speeds

This technical bulletin looks at the effect of collecting high resolution patterns at high speeds on metals: astonishing angular resolution, even at 3000 pps.

PDF 3.22MB