SDD for particle analysisA range of Silicon Drift Detectors (SDD) for particle analysis applications

Oxford Instruments’ X-MaxN Silicon Drift Detector comes in a range of sizes to suit budget and application - from 20 mm2 for basic microanalysis up to an astounding 150 mm2 for advanced nanoanalysis. The latter is the largest SDD in the market and delivers more than double the speed of any other detector.

  • A range of silicon drift detector sizes
  • From 150 mm2 to 20 mm2
  • The same geometry inside the SEM means count rate increases in proportion to sensor size

All X-MaxN detectors provide:

  • The best low energy performance – all detectors clearly resolve Be
  • The same excellent resolution, guaranteed on your microscope
  • The same physical geometry, so existing systems can be easily upgraded

Using a larger sensor means:

  • Usable count rates at lower currents
  • Maximising imaging performance and accuracy enabling the detection of sub-micron particles and nanoparticles
  • Significantly higher count rates at the same beam current
  • Shorter acquisition times and better statistical confidence
  • Practical analysis with small beam diameters, maximising spatial resolution

For applications that do not demand the full X-MaxN performance, x-act is available. It is a fully quantitative 10 mm2 SDD with excellent performance at low and high count rates.

Multiple detector systems

When used in automated process control, adding one or more extra detectors can significantly enhance the sample throughput.

For challenging applications, where very small particles or particles on beam sensitive sample such as some polycarbonate filters are being is not an option. In such cases multiple detectors can provide an effective solution to enhance the collection efficiency so that particle detection can progress rapidly. For samples where particle size varies significantly, shadowing of smaller particles by larger particles can be a significant issue when only one detector is used. Having at least two detectors mounted on opposing ports can overcome these shadowing effects.

  • Up to four X-MaxN can run in parallel on one microscope to create a system with a total active area of 600 mm2
  • Multiple detectors enable the analysis of:
    • Nanoscale particles at low kV where the highest solid angle is required
    • Particles on beam sensitive substrates (e.g. filters, resins etc)
    • Samples of particles with varying size where shadowing of smaller particles is an issue (see the image at the top of this page).

A multiple detector system not only achieves faster sample throughput, it also reduces the effect of shadowing.

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