FIB imageLayerProbe provides a new way to quantify TEM lamella thickness and quality in situ - as well as a complimentary technique to the cross-sectional analysis of layered specimens on FIB-SEMs.
 

  • LayerProbe takes only seconds to characterise the lamella thickness and to detect and measure any implanted Gallium
  • Its precise thickness measurement enables faster preparation of high-quality, ultra-thin lamellae
  • Sub-surface defects are pinpointed to identify locations where to cut with the FIB-SEM
  • LayerProbe can also characterise and optimise the quality of layers deposited or processed in the FIB using gas assisted deposition and etching