Materials characterisation at 2kV or less

  • Fully integrate EDS where very low kV electron microscopy benefits sample characterisation
    • For  enhanced signal contrast
    • Reduction of sample damage e.g for polymers and soft coatings
    • Reduce charging or achieving charge balance conditions

Example
Reducing accelerating voltage from 10 to 1.5kV allows electron image contrast to show the distribution of oxide particles. X-ray mapping under the same conditions characterises precipitates as MnOB. Map acquisition time 15 minutes. Sample courtesy of JFE Steel

materials characterisation at 2kV or less