Materials characterisation at 2kV or less

  • Fully integrate EDS where very low kV electron microscopy benefits sample characterisation
    • For  enhanced signal contrast
    • Reduction of sample damage e.g for polymers and soft coatings
    • Reduce charging or achieving charge balance conditions

Example
Reducing accelerating voltage from 10 to 1.5kV allows electron image contrast to show the distribution of oxide particles. X-ray mapping under the same conditions characterises precipitates as MnOB. Map acquisition time 15 minutes. Sample courtesy of JFE Steel

materials characterisation at 2kV or less

Congratulations to Dr Kate A. Ross for winning the 2018 Lee Osheroff Richardson (LOR) Science Prize for North and S… https://t.co/5GEVpMSy6K
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