With X-Max Extreme users can characterise the composition and distribution of surface contaminants and layers a few atoms thick.

  • Integrate characterisation of surfaces with SEM investigation
  • Analyse the surface structures only visible with in-lens detectors at very low kV and short working distance
  • Save money and time vs Auger/XPS

Example: X-ray Maps collected at 1kV to characterise high-end electronic component stain detected using In Lens SE imaging.

Surface science and EDS

Watch our latest webinar On Demand to find out ‘How Ion Beam Deposition enables high power lasers’… https://t.co/0z7DkZh0LQ
11:45 AM - 23 Mar 18
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