• Sub 10 nm element characterisation in the SEM
  • X-ray map resolution close to SEM resolution

Example 1: Sn imaging standard

Nano-characterisation of Sn nano-spheres

X-ray mapping at 2kV of tin nano-sphere high resolution imaging standard, 6,500cps, 15 min acquisition time.


Example 2: Ni-base Superalloy

Ni base Superalloy characterisation

Fine Ni3(NbTi) gamma” precipitates in Alloy 718, collected at 1.5 kV, 2,000cps for 18 minutes - Sample and data courtesy of University of Manchester.

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