x-act Silicon Drift DetectorThe x-act is a fully quantitative SDD with excellent performance at low and high count rates. It provides all the benefits of Oxford Instruments’ renowned technology in a package that is suitable for applications that do not demand the full performance of the large area X-MaxN detectors.

x-act incorporates 40 years of Oxford Instruments’ expertise,and is backed up by worldwide sales, service and customer support specialists.

Overview

  • Detects elements from Be to Pu
  • Premium resolution of 125 eV available, guaranteed on your SEM
  • Resolution measured in compliance with ISO 15632:2012
  • Compatible with INCA® and AZtec® EDS analysis software

 

x-act Brochure

x-act

The x-act is a fully quantitative SDD with excellent performance at low and high count rates. It provides all the benefits of Oxford Instruments' renowned technology in a package that is suitable for applications that do not demand the full performance of the larg area X-Max® detectors.

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x-act features

  • Reliable AutoID for element identification
  • Accurate quant – all count rates
  • Stability guaranteed from 1,000 to 100,000 cps – peak shift and resolution change <1 eV
  • Full software correction at very high count rates including pile-up correction
  • Excellent low energy analysis with detection from Be to Pu
  • Resolution guaranteed on SEM at MnKa, FKa, and CKa
  • In compliance with ISO 15632:2012
  • Fully integrated analytical hardware chain for fast, reliable analytical performance

x-act advantages

  • A high quality SDD for routine EDS applications where the performance of the X-MaxN is not needed
  • Up to 10x count rates of Si(Li) detectors, for increased productivity and no loss of analytical performance
  • LN2-free operation

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