• Voltage biasing of ±10V is included as standard, with the ability to run configurable current-voltage sweeps for device characterisation, or verification of correct nanoprobing. This also enables acquisition of images with voltage contrast, and assists nanoprobe touchdown.
  • Multiple probe configurations, alongside stage connection, enable complex device probing and configuration. Standard BNC connectors are provided for third party equipment, to enable more complex nanoprobing analysis in the SEM.
Dr Ziad Melhem of Oxford Instruments NanoScience will be giving a talk at MIT on the enabling technologies, require… https://t.co/MDz2SojzYv
5:21 PM - 16 Feb 18
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