• Voltage biasing of ±10V is included as standard, with the ability to run configurable current-voltage sweeps for device characterisation, or verification of correct nanoprobing. This also enables acquisition of images with voltage contrast, and assists nanoprobe touchdown.
     
  • Multiple probe configurations, alongside stage connection, enable complex device probing and configuration. Standard BNC connectors are provided for third party equipment, to enable more complex nanoprobing analysis in the SEM.