• Built-in calibration mode with determination of true zero and beam currents, enables automatic management of calibrated EBIC data and quantified workflows. Quantified current signal is essential for comparison between samples and devices, as well as further analysis and data extraction.
Dr Ziad Melhem of Oxford Instruments NanoScience will be giving a talk at MIT on the enabling technologies, require… https://t.co/MDz2SojzYv
5:21 PM - 16 Feb 18
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